Wafer and Thin Film Instrumentation Suppliers in Santa Barbara, California

Instruments such as quartz crystal microbalance (QCM) monitors, ellipsometers, RHEED systems, imaging stations, CD-SEMs, ion mills, C-V systems specifically designed for wafer metrology or in-situ monitoring of thin film parameters during thin film or semiconductors wafer processing. (more)
Bruker Nano Surfaces & Metrology
Address: 112 Robin Hill Road, Santa Barbara, CA 93117 United States
Business Type: Manufacturer
Description: Surface Analysis Revealing Surface Interactions, Functionality, and Precise Topography for Research and Industry From leading edge scientific research to high-speed production, Bruker provides the critical surface measurements necessary for success with the world's broadest range of... (more)

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